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Integrated EOL Cluster for
parallel
devices testing in strip
Features:
- Parallel device testing in singulated /strip form
- Standard carrier design with max. effective loading area of 75mm x 260mm
- Electronic ID for carrier identification
- Programmable 30axis carrier indexer
- Short indexing time
- Carrier exchange Time: 2.0 - 3.7s
- Within carrier : 0.4s up to 20mm travel
- Ambient/hot test environment typical: 135 degree C
- Optional up to 155 degree C
- in-house design test contactor
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flexitest 1000
Integrated EOL Cluster
- Parallel devices testing in strip
flexitest 1000
Standalone Matrix Test Handler
- Parallel devices testing in singulated form
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